CIM-200 (DIC) / 10134 Advanced Inverted Differential Interference Contrast System
The CIM-200 (DIC) / Model 10134 is our premier inverted metallurgical research station, integrating high-end Differential Interference Contrast (DIC) technology for the three-dimensional visualization of metal surfaces. As a specialized CIM-200 (DIC) Manufacturer in India, we have engineered this system to reveal minute topographical details, scratches, and grain boundaries that remain invisible under standard brightfield or darkfield illumination. The inverted configuration is specifically designed to accommodate massive, oversized, and heavy industrial specimens with minimal sample preparation.
Leading as a global CIM-200 (DIC) 10134 Exporter, we provide this workstation with high-aperture infinity-corrected plan achromatic DIC objectives and a precision Nomarski prism assembly. The CIM-200 series excels in Advanced Material Science, allowing for the observation of transparent and semi-transparent layers on opaque substrates. It features a high-intensity 100W Kohler illumination system, ensuring the optical power required for complex phase analysis in Nanotechnology and Semiconductor Engineering.
Optical System Infinity Color Corrected Research Grade
DIC Components Nomarski Prisms & Polarizing Modules
Illumination 12V/100W Halogen Kohler Epi-Light
Nosepiece Sextuple (6-Hole) Reversed Type
Objectives Plan Semi-Apo DIC 5x, 10x, 20x, 50x, 100x
Mechanical Stage 240mm x 210mm Heavy Duty Inverted Stage
The CIM-200 (DIC) is the standard for Wafer Defect Metrology, Super-Alloy Microstructure Analysis, and Thin Film Characterization. It is an indispensable tool for Research Institutes and Aerospace Defense Labs where the topographical accuracy of metal surfaces is critical for component safety and performance reporting.
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1. What is the benefit of DIC (Differential Interference Contrast) in metallurgy? DIC creates a pseudo-3D image of the sample surface, allowing you to see topographical features, height differences, and fine textures that are flat under normal light. 2. Can the CIM-200 (DIC) perform standard brightfield observation? Yes, the DIC prisms can be easily removed from the optical path, allowing the microscope to function as a high-performance brightfield/polarizing inverted system. 3. Does it support high-speed digital imaging? Absolutely. It features a dedicated camera port designed for 4K high-speed microscopy cameras for real-time video and image documentation. 4. Is the Nomarski prism adjustable? Yes, the CIM-200 includes a precision-adjustable Nomarski slider that allows the user to optimize the contrast and relief effect for different materials.
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