Model No:CAI-31
|
Wavelength Range |
340 – 960 nm |
|
Resolution |
%T: 0.1, Abs: 0.001, Conc.: 1 |
|
Output |
%T: 0 – 100, Abs: 0 – 1.99, Conc.: 0 – 1999 |
|
Light Source |
High Power LED Light |
|
Detector |
Silicon Photodiode |
|
Monochromator |
600 line/mm Holographic Grating |
|
Sample Holder |
10 mm glass square cuvettes |
|
Spectral Bandwidth |
5 nm |
|
Wavelength Resolution |
1 nm |
|
Wavelength Accuracy |
+- 2.5 nm |
|
Display |
16x2 LCD |
|
Power |
220 Volt +-10%, 50 Hz |
|
Function Keys |
Set Zero |
|
Dimensions |
475 x 285 x 130 mm (Approx.) |
|
Weight |
10 Kg Approx |
|
Accessory |
Glass Square Cuvettes of 10 mm path-length: A set of 2 |
Professionals looking for versatile testing configurations frequently explore our specialized digital spectrophotometer portfolio. Built with dual-screen architecture, this instrument simultaneously exhibits photometric absorption, optical transmission, and concentration values without toggling screens, maximizing workplace efficiency.
Our dual digital display units feature robust monochromators, high-resolution diffraction gratings, and long-life tungsten-halogen light sources. Laboratories seeking reliable equipment can source units that match strict industrial benchmarks while evaluating competitive digital spectrophotometer price structures for bulk institutional procurement.
It is an advanced analytical device equipped with two separate readout screens, allowing technicians to monitor transmission, optical density, or concentration values simultaneously for faster execution.
Purchasing directly from an experienced manufacturer guarantees precision calibration, long-term operational stability, comprehensive spare parts availability, and expert technical support.
Standard visible range models typically operate across a broad spectral band from 340 nm to 1000 nm, catering to a diverse variety of chemical and clinical colorimetric assays.
The dual display configuration eliminates the need for manual mode-switching between %T and absorbance, significantly reducing human error and testing time during high-throughput sample runs.